AI-assisted development of failure prediction algorithms for analog electronics applied to the CROME system

Submitted by ogomezal on
Type
Meeting
Timezone
Europe/Zurich
Location
CERN
Room
24/1-016
Category
RP Seminars
Category ID
11171
Indico iCal
https://indico.cern.ch/export/event/1346377.ics
Room Map URL
https://maps.cern.ch/mapsearch/mapsearch.htm?n=['24/1-016']
Start Date
End Date